Buy 176514-0001 Part of Bae Systems Information And Electronic Systems Integration Inc with NSN 5962-01-381-0155
MPN: 176514-0001
Alternate P/N: 1765140001
NSN: 5962-01-381-0155
Item Name: Microcircuit Memory
CAGE Code: 19397
Part number 176514-0001 is available for immediate shipping. The NSN for part number is 5962013810155. This part is manufactured by Bae Systems Information And Electronic Systems Integration Inc. It is described as Microcircuit Memory. Would you like to request a quote for part number 176514-0001? Please fill out the form.
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NSN Information for Part Number 176514-0001 with NSN 5962-01-381-0155, 5962013810155
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-381-0155 Item Description: Microcircuit Memory | 5962 | 013810155 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 176514-0001 | 5 | 2 | 3 |
Characteristics Data of NSN 5962-01-381-0155, 5962013810155
| MRC | Criteria | Characteristic |
|---|---|---|
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
| ADAT | BODY WIDTH | 0.310 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 1.2 WATTS |
| ADAU | BODY HEIGHT | 0.185 INCHES MAXIMUM |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND MONOLITHIC AND ELECTROSTATIC SENSITIVE AND PROGRAMMED |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-9 MIL-M-38510 |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | LOGIC ARRAY, SEMICUSTOM, (22V10), PRGMD |
| CZEP | CAPITANCE RATING PER CHARACTERISTIC | 8.00 INPUT PICOFARADS MAXIMUM AND 12.00 OUTPUT PICOFARADS MAXIMUM |
| CZER | MEMORY DEVICE TYPE | PAL |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| ADAQ | BODY LENGTH | 1.280 INCHES MAXIMUM |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 15.00 MILLIAMPERES MAXIMUM SUPPLY |
| CZEQ | TIME RATING PER CHACTERISTIC | 40.00 NANOSECONDS MAXIMUM DELAY |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CQZP | INPUT CIRCUIT PATTERN | 22 INPUT |
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