Buy 8202502YB Part of Freescale Semiconductor Inc with NSN 5962-01-217-4206
MPN: 8202502YB
Manufacturer: Freescale Semiconductor Inc
NSN: 5962-01-217-4206
Item Name: Microcircuit Memory
CAGE Code: 04713
Part number 8202502YB is available for immediate shipping. The NSN for part number is 5962012174206. This part is manufactured by Freescale Semiconductor Inc. It is described as Microcircuit Memory. Would you like to request a quote for part number 8202502YB? Please fill out the form.
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NSN Information for Part Number 8202502YB with NSN 5962-01-217-4206, 5962012174206
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-217-4206 Item Description: Microcircuit Memory | 5962 | 012174206 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 8202502yb | 2 | 1 | 5 |
Characteristics Data of NSN 5962-01-217-4206, 5962012174206
| MRC | Criteria | Characteristic |
|---|---|---|
| MEMORY | ADAQ | BODY LENGTH1 300 INCHES MAXIMUM |
| MEMORY | ADAT | BODY WIDTH0 520 INCHES NOMINAL |
| MEMORY | ADAU | BODY HEIGHT0 205 INCHES MAXIMUM |
| MEMORY | AFGA | OPERATING TEMP RANGE-25 0 TO 75 0 DEG CELSIUS |
| MEMORY | AFJQ | STORAGE TEMP RANGE-65 0 TO 150 0 DEG CELSIUS |
| MEMORY | CBBL | FEATURES PROVIDEDPROGRAMMABLE AND MONOLITHIC AND ULTRAVIOLET ERASABLE |
| MEMORY | CQSJ | INCLOSURE MATERIALCERAMIC |
| MEMORY | CQSZ | INCLOSURE CONFIGURATIONDUAL-IN-LINE |
| MEMORY | CQWX | OUTPUT LOGIC FORMN-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| MEMORY | CQZP | INPUT CIRCUIT PATTERN17 INPUT |
| MEMORY | CRHL | BIT QUANTITY131072 |
| MEMORY | CSWJ | WORD QUANTITY16384 |
| MEMORY | CWSG | TERMINAL SURFACE TREATMENTSOLDER |
| MEMORY | CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC-0 5 VOLTS MAXIMUM POWER SOURCE AND 7 0 VOLTS MAXIMUM POWER SOURCE |
| MEMORY | CZEQ | TIME RATING PER CHACTERISTIC250 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME LOW TO HIGH LEVEL OUTPUT AND 250 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME HIGH TO LOW LEVEL OUTPUT |
| MEMORY | CZER | MEMORY DEVICE TYPEROM |
| MEMORY | TEST | TEST DATA DOCUMENT96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS INDIVIDUAL MANUFACTUREER STANDARDS ETC |
| MEMORY | TTQY | TERMINAL TYPE AND QUANTITY28 PRINTED CIRCUIT |
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