Buy IDM29705F-MIL Part of National Semiconductor Corp with NSN 5962-01-180-3303
MPN: IDM29705F-MIL
Alternate P/N: IDM29705FMIL
Manufacturer: National Semiconductor Corp
NSN: 5962-01-180-3303
Item Name: Microcircuit Memory
CAGE Code: 27014
Part number IDM29705F-MIL is available for immediate shipping. The NSN for part number is 5962011803303. This part is manufactured by National Semiconductor Corp. It is described as Microcircuit Memory. Would you like to request a quote for part number IDM29705F-MIL? Please fill out the form.
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NSN Information for Part Number IDM29705F-MIL with NSN 5962-01-180-3303, 5962011803303
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-180-3303 Item Description: Microcircuit Memory | 5962 | 011803303 | N | B | ||
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| A | 0 | |||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| Idm29705f-Mil | 3 | 1 | 5 |
Characteristics Data of NSN 5962-01-180-3303, 5962011803303
| MRC | Criteria | Characteristic |
|---|---|---|
| MEMORY | ADAQ | BODY LENGTH0 690 INCHES MINIMUM AND 0 725 INCHES MAXIMUM |
| MEMORY | ADAT | BODY WIDTH0 620 INCHES MINIMUM AND 0 660 INCHES MAXIMUM |
| MEMORY | ADAU | BODY HEIGHT0 070 INCHES MINIMUM AND 0 115 INCHES MAXIMUM |
| MEMORY | AFGA | OPERATING TEMP RANGE-55 0125 0 DEG CELSIUS |
| MEMORY | AFJQ | STORAGE TEMP RANGE-65 0150 0 DEG CELSIUS |
| MEMORY | CBBL | FEATURES PROVIDEDWENABLE AND LOW POWER AND SCHOTTKY |
| MEMORY | CQSJ | INCLOSURE MATERIALCERAMIC |
| MEMORY | CQSZ | INCLOSURE CONFIGURATIONFLAT PACK |
| MEMORY | CQWX | OUTPUT LOGIC FORMTRANSISTOR-TRANSISTOR LOGIC |
| MEMORY | CQZP | INPUT CIRCUIT PATTERN18 INPUT |
| MEMORY | CRHL | BIT QUANTITY64 |
| MEMORY | CSWJ | WORD QUANTITY16 |
| MEMORY | CWSG | TERMINAL SURFACE TREATMENTSOLDER |
| MEMORY | CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC5 5 VOLTS MAXIMUM POWER SOURCE |
| MEMORY | CZEQ | TIME RATING PER CHACTERISTIC20 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME LOW TO HIGH LEVEL OUTPUT AND 20 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME HIGH TO LOW LEVEL OUTPUT |
| MEMORY | CZER | MEMORY DEVICE TYPERAM |
| MEMORY | TEST | TEST DATA DOCUMENT96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS INDIVIDUAL MANUFACTUREER STANDARDS ETC |
| MEMORY | TTQY | TERMINAL TYPE AND QUANTITY28 FLAT LEADS |
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